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Margarita Zakharova

Contact: tibiboreth@gmail.com

Research Topics: Emerging X-ray Optics, Grating based X-ray imaging
 

Margarita Zakharova is a Master student from Tomsk Polytechnic University (TPU) working in collaboration with the Institute of Microstructure Technology (IMT) Karlsruhe Institute of Technology (KIT). Since March 2016 she is doing experimental part for her Master thesis with the development of two-dimensional gratings for SSI. She received Bachelor degree in Physics at the TPU in June 2015. She also worked as an intern at the Institute of Photon Science (IPS) KIT with X-ray diffraction and reflectivity methods.

Contribution: Particle size sensitive single-shot imaging for investigation of structures at sub-μ scale

Performance and properties of materials are directly influenced by their inner structure. In case of composite materials the most interesting characteristics to study are distribution of particles inserted into polymer matrix and fiber orientations. As the complex structure of composites might include different material types it is also important to obtain significant contrast between metal, ceramic and polymer components. Such a comprehensive study can be performed using imaging techniques which offer multimodal information based on absorption, phase contrast and small-angle scattering. As Fourier transformation relates X-ray scattering to the electron density distribution the sub-μ structure of material can be investigated with a certain sensitivity threshold depending on the setup configuration. Grating-based Single-shot Imaging (GbSSI) technique with two-dimensional optical components allows tuning of grating-detector distances due to the simplicity of a setup. It has been demonstrated that it is possible to obtain particle size sensitivity for structures at the scale of 60-200 nm for biomaterials using energies below 30 keV in a compact laboratory setup. Along with size-dependent scattering information conventional absorption and two-dimensional phase contrast can be obtained simultaneously. To implement particle size sensitive imaging for a broad industrial application it is necessary to adapt the method and develop two-dimensional optical component for imaging at high energies.

By this contribution we provide an overview of single-shot imaging techniques allowing performing particle size sensitivity measurements for non-destructive testing.
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